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KLA RS75/tc
    描述
    - Includes computer and manual - Never Been Used, Perfect condition
    配置
    Resistivity Mapping System
    OEM 代工型號說明
    The OmniMap® RS75/tc is a resistivity mapping system designed to help semiconductor manufacturers perform accurate wafer characterization and critical production monitoring at substantially greater speeds. It addresses a wide variety of process applications where film thickness and sheet resistance are critical, such as ion implantation, metallization, diffusion, epitaxy and polysilicon. The RS75/tc model incorporates a patented temperature compensation (tc) solution, allowing the system to correct for temperature variations, dramatically affecting long-term repeatability, accuracy, and system-to-system matching. With measurement speed of approximately 1 second per test site, the tool can process a 25-slot cassette of 200mm wafers at over 100 wafers per hour. This includes five-site monitoring, with automatic temperature compensation and flat alignment. The RS75 series is offered in a variety of configurations to meet customer production requirements.
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    KLA

    RS75/tc

    verified-listing-icon

    已驗證

    類別
    Metrology

    上次驗證: 22 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    103705


    晶圓尺寸:

    未知


    年份:

    未知

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    類似上架商品
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    KLA RS75/tc

    KLA

    RS75/tc

    Metrology
    年份: 1996條件: 二手
    上次驗證超過60天前

    KLA

    RS75/tc

    verified-listing-icon
    已驗證
    類別
    Metrology
    上次驗證: 22 天前
    listing-photo-332a438de8df482da4b73ae9966eaec9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77608/332a438de8df482da4b73ae9966eaec9/c8e9d0b24b074ba0bf18c73f5abba0e7_b4bf4784f65e42369a18ff077213e340_mw.jpeg
    listing-photo-332a438de8df482da4b73ae9966eaec9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77608/332a438de8df482da4b73ae9966eaec9/2380188e95cc401d972a65ff1ed83446_bc6f9b6b424345bb882934f146c5b00e45005c_mw.jpeg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    103705


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    - Includes computer and manual - Never Been Used, Perfect condition
    配置
    Resistivity Mapping System
    OEM 代工型號說明
    The OmniMap® RS75/tc is a resistivity mapping system designed to help semiconductor manufacturers perform accurate wafer characterization and critical production monitoring at substantially greater speeds. It addresses a wide variety of process applications where film thickness and sheet resistance are critical, such as ion implantation, metallization, diffusion, epitaxy and polysilicon. The RS75/tc model incorporates a patented temperature compensation (tc) solution, allowing the system to correct for temperature variations, dramatically affecting long-term repeatability, accuracy, and system-to-system matching. With measurement speed of approximately 1 second per test site, the tool can process a 25-slot cassette of 200mm wafers at over 100 wafers per hour. This includes five-site monitoring, with automatic temperature compensation and flat alignment. The RS75 series is offered in a variety of configurations to meet customer production requirements.
    文檔

    無文檔

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    查看全部
    KLA RS75/tc

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