描述
無描述配置
-300mm Ready Non-Contact Magnetic Property Metrology System for MRAM - 2 Axis 2.5TOEM 代工型號說明
The MicroSense® PKMRAM system utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize multi-layer wafers’ magnetic properties used to develop and manufacture perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of the magnetic properties of entire wafers up to 300mm. The system is available in both manual loading or fully-automated configurations to meet R&D and/or production requirements.文檔
無文檔
KLA / MICROSENSE
PKMRAM
已驗證
類別
Metrology
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
106397
晶圓尺寸:
12"/300mm
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / MICROSENSE
PKMRAM
類別
Metrology
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
106397
晶圓尺寸:
12"/300mm
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
-300mm Ready Non-Contact Magnetic Property Metrology System for MRAM - 2 Axis 2.5TOEM 代工型號說明
The MicroSense® PKMRAM system utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize multi-layer wafers’ magnetic properties used to develop and manufacture perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of the magnetic properties of entire wafers up to 300mm. The system is available in both manual loading or fully-automated configurations to meet R&D and/or production requirements.文檔
無文檔