描述
無描述配置
WAFER TESTER FOR WAFER THICKNESS INCLUDES LARGE ANVIL STYLE TABLE TO HOLD SMALL OR LARGE SUBSTRATESOEM 代工型號說明
未提供文檔
無文檔
KLA / MICROSENSE
6033
已驗證
類別
Metrology
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
83679
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / MICROSENSE
6033
類別
Metrology
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
83679
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
WAFER TESTER FOR WAFER THICKNESS INCLUDES LARGE ANVIL STYLE TABLE TO HOLD SMALL OR LARGE SUBSTRATESOEM 代工型號說明
未提供文檔
無文檔