跳到主要內容
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
FOGALE Nanotech DEEPROBE 300-M
    描述
    無描述
    配置
    Technology: Low Conherence IR interferometry for step high measurement Applications: High A/R TSV depth measurement for 200 and 300mm wafer (Via first & Middle) Benefits: Non destructieve Technology Fast and easy to use CCD camera for spot positioning and pattern recognition Adjustable Metrology spot size TSV diameter > 2um A:R up to 30 Calibration and maintenance free
    OEM 代工型號說明
    未提供
    文檔

    無文檔

    FOGALE Nanotech

    DEEPROBE 300-M

    verified-listing-icon

    已驗證

    類別
    Metrology

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    65311


    晶圓尺寸:

    未知


    年份:

    2014


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    FOGALE Nanotech DEEPROBE 300-M

    FOGALE Nanotech

    DEEPROBE 300-M

    Metrology
    年份: 2014條件: 二手
    上次驗證超過60天前

    FOGALE Nanotech

    DEEPROBE 300-M

    verified-listing-icon
    已驗證
    類別
    Metrology
    上次驗證: 超過60天前
    listing-photo-ee62b1b88bf8418581a8e2ec6e1a3dd8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1148/ee62b1b88bf8418581a8e2ec6e1a3dd8/b6967029681f437793aa48874c796609_a07b6f7e993e45469312c334ca2450ff1201a_mw.jpeg
    listing-photo-ee62b1b88bf8418581a8e2ec6e1a3dd8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1148/ee62b1b88bf8418581a8e2ec6e1a3dd8/9356a82a06ce458885b2a1ca1f3af8f0_c867c35ca1da4763959ca4b2039dd4581201a_mw.jpeg
    listing-photo-ee62b1b88bf8418581a8e2ec6e1a3dd8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1148/ee62b1b88bf8418581a8e2ec6e1a3dd8/e8462c4b759f4d98a54c63c4936c72f9_de979439bba24064ba701c03ac344b5f1201a_mw.jpeg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    65311


    晶圓尺寸:

    未知


    年份:

    2014


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    Technology: Low Conherence IR interferometry for step high measurement Applications: High A/R TSV depth measurement for 200 and 300mm wafer (Via first & Middle) Benefits: Non destructieve Technology Fast and easy to use CCD camera for spot positioning and pattern recognition Adjustable Metrology spot size TSV diameter > 2um A:R up to 30 Calibration and maintenance free
    OEM 代工型號說明
    未提供
    文檔

    無文檔

    類似上架商品
    查看全部
    FOGALE Nanotech DEEPROBE 300-M

    FOGALE Nanotech

    DEEPROBE 300-M

    Metrology年份: 2014條件: 二手上次驗證:超過60天前
    FOGALE Nanotech DEEPROBE 300-M

    FOGALE Nanotech

    DEEPROBE 300-M

    Metrology年份: 0條件: 二手上次驗證:超過60天前