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CAMECA IMS-4F
    描述
    無描述
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    OEM 代工型號說明
    The Cameca IMS 4F is the successor to the IMS 3F and contains all the features of its predecessor plus improvements of the basic instrument as well as new accessories. It is an ion microprobe that is based on the phenomenon of ion-induced sputtering of a solid sample by an energetic primary ion beam, typically consisting of oxygen or cesium ions at beam energy of 5 – 20 keV. It is a tool for investigating isotopic composition in the chemical, material, geological and biological sciences and can detect all elements (H to U) in depth profiling, surface, bulk and microanalysis modes.
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    文件圖示

    Cameca IMS 4F.pdf

    CAMECA

    IMS-4F

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    類別
    Metrology

    上次驗證: 超過60天前

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    產品編號:

    59344

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    年份:

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    CAMECA IMS-4F

    CAMECA

    IMS-4F

    Metrology
    年份: 0條件: 二手
    上次驗證超過60天前

    CAMECA

    IMS-4F

    verified-listing-icon
    已驗證
    類別
    Metrology
    上次驗證: 超過60天前
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/6027a6c6966e452c84838e38578e628e_labspettrometriamassaionisecondarifig1_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/7018c249ae3a4cb89a782aa35ba9ca62_labspettrometriamassaionisecondarifig2_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/5fc16fa72d9a45638a4b5862c3cbd5ca_labspettrometriamassaionisecondarifig3_mw.jpeg
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    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/ab7df4728de24c968735e271aaf17ccd_1902f26f8f1844638b6c54599010528a1201a_mw.jpeg
    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    59344

    晶圓尺寸:

    未知

    年份:

    未知

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The Cameca IMS 4F is the successor to the IMS 3F and contains all the features of its predecessor plus improvements of the basic instrument as well as new accessories. It is an ion microprobe that is based on the phenomenon of ion-induced sputtering of a solid sample by an energetic primary ion beam, typically consisting of oxygen or cesium ions at beam energy of 5 – 20 keV. It is a tool for investigating isotopic composition in the chemical, material, geological and biological sciences and can detect all elements (H to U) in depth profiling, surface, bulk and microanalysis modes.
    文檔
    文件圖示

    Cameca IMS 4F.pdf

    類似上架商品
    查看全部
    CAMECA IMS-4F

    CAMECA

    IMS-4F

    Metrology年份: 0條件: 二手上次驗證: 超過60天前