描述
Epi Metrology & Testers配置
Software Version: Carmel Version 2015.3.8300 / Lynx Version 2.15.3.8300 Lasers: 355nm and 405nm Process: Photoluminescence on InGaN or AlInGaP LED wafers Spare Parts: Potentially some available PL SystemOEM 代工型號說明
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.文檔
無文檔
類別
Metrology
上次驗證: 17 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
134527
晶圓尺寸:
6"/150mm
年份:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
IMPERIA
類別
Metrology
上次驗證: 17 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
134527
晶圓尺寸:
6"/150mm
年份:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Epi Metrology & Testers配置
Software Version: Carmel Version 2015.3.8300 / Lynx Version 2.15.3.8300 Lasers: 355nm and 405nm Process: Photoluminescence on InGaN or AlInGaP LED wafers Spare Parts: Potentially some available PL SystemOEM 代工型號說明
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.文檔
無文檔