描述

無描述

配置

無配置

OEM 代工型號說明

UltraScan Wafer Metrology System The 9600 and 9650 systems, introduced in 1994 and based on the more advanced E-Plus station, measure thickness down to an accuracy of 0.25 microns.

文檔

無文檔

KLA / ADE

ULTRASCAN 9600

已驗證

類別

Metrology

上次驗證: 超過60天前

關鍵商品詳情

條件:

Used

作業狀態:

未知

產品編號:

94019

晶圓尺寸:

未知

年份:

未知

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Logistics Support

Available

Money Back Guarantee

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

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KLA / ADE

ULTRASCAN 9600

Metrology

年份: 0條件: 二手

上次驗證超過60天前

KLA / ADE

ULTRASCAN 9600

已驗證

類別

Metrology

上次驗證: 超過60天前

listing-photo-1680cd99fe0c4637bda624e656d5eada-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png

關鍵商品詳情

條件:

Used

作業狀態:

未知

產品編號:

94019

晶圓尺寸:

未知

年份:

未知

Logistics Support

Available

Money Back Guarantee

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

描述

無描述

配置

無配置

OEM 代工型號說明

UltraScan Wafer Metrology System The 9600 and 9650 systems, introduced in 1994 and based on the more advanced E-Plus station, measure thickness down to an accuracy of 0.25 microns.

文檔

無文檔

類似上架商品

查看全部

KLA / ADE

ULTRASCAN 9600

Metrology年份: 0條件: 二手上次驗證: 超過60天前