描述
無描述配置
・Light source; argon-ion laser (λ = 488 nm, and 20 mW) detection method; scattered light detection method; spiral scanning method maximum detection sensitivity (practical measurable particle size); 0.100 μm dynamic range; 0.100 to 5.153 μm (calibrated with standard particles) detection reproducibility; (σn/X) × 100 with 1% or less cleanliness of equipment; 0.5 or less with a total number of counts of 0.100 μm or moreOEM 代工型號說明
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TAKANO / TOPCON
WM-1500
已驗證
類別
Mask Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
26025
晶圓尺寸:
6"/150mm, 8"/200mm
年份:
1997
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TAKANO / TOPCON
WM-1500
類別
Mask Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
26025
晶圓尺寸:
6"/150mm, 8"/200mm
年份:
1997
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
・Light source; argon-ion laser (λ = 488 nm, and 20 mW) detection method; scattered light detection method; spiral scanning method maximum detection sensitivity (practical measurable particle size); 0.100 μm dynamic range; 0.100 to 5.153 μm (calibrated with standard particles) detection reproducibility; (σn/X) × 100 with 1% or less cleanliness of equipment; 0.5 or less with a total number of counts of 0.100 μm or moreOEM 代工型號說明
未提供文檔
無文檔