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TAKANO / TOPCON WM-2500
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    OEM 代工型號說明
    Light source: Argon ion laser Detecting/scanning method: Scattered light detecting / helical scanning method Detectivity: Bare 0.055 microns / film 0.07 microns Dynamic range: 0.055 microns to 5 microns Reproducibility: σn /≦1% Wafer Size 200/150mm
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    TAKANO / TOPCON

    WM-2500

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    已驗證

    類別
    Mask Inspection

    上次驗證: 超過60天前

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    條件:

    Used


    作業狀態:

    未知


    產品編號:

    96886


    晶圓尺寸:

    8"/200mm


    年份:

    未知

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    TAKANO / TOPCON WM-2500

    TAKANO / TOPCON

    WM-2500

    Mask Inspection
    年份: 0條件: 二手
    上次驗證超過60天前

    TAKANO / TOPCON

    WM-2500

    verified-listing-icon
    已驗證
    類別
    Mask Inspection
    上次驗證: 超過60天前
    listing-photo-297dd955a830499b819de9b3782ef6d9-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    96886


    晶圓尺寸:

    8"/200mm


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    Light source: Argon ion laser Detecting/scanning method: Scattered light detecting / helical scanning method Detectivity: Bare 0.055 microns / film 0.07 microns Dynamic range: 0.055 microns to 5 microns Reproducibility: σn /≦1% Wafer Size 200/150mm
    文檔

    無文檔

    類似上架商品
    查看全部
    TAKANO / TOPCON WM-2500

    TAKANO / TOPCON

    WM-2500

    Mask Inspection年份: 0條件: 二手上次驗證: 超過60天前
    TAKANO / TOPCON WM-2500

    TAKANO / TOPCON

    WM-2500

    Mask Inspection年份: 0條件: 二手上次驗證: 超過60天前