We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 閱讀詳情
描述
Tester配置
無配置OEM 代工型號說明
The Thermo Scientific™ Orion3™ is designed to test for potentially destructive effects of ESD, enabling the identification and hardening of sensitive structures prior to full-scale production. Given the extremely high cost of IC production, as well as customer demands for precisely timed component delivery schedules, the Orion3 can save substantial costs in terms of time, material and lost opportunity (time to market). The high resolution dual cameras permit easy and rapid discharge pin alignment during the test setup routine. Both the x and y axis are displayed simultaneously. The cameras may be left on during the test to monitor the pin alignment. Vacuum hold-down enables device testing regardless of device types and sizes.文檔
無文檔
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
121860
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMO / KEYTEK
ORION3
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
121860
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Tester配置
無配置OEM 代工型號說明
The Thermo Scientific™ Orion3™ is designed to test for potentially destructive effects of ESD, enabling the identification and hardening of sensitive structures prior to full-scale production. Given the extremely high cost of IC production, as well as customer demands for precisely timed component delivery schedules, the Orion3 can save substantial costs in terms of time, material and lost opportunity (time to market). The high resolution dual cameras permit easy and rapid discharge pin alignment during the test setup routine. Both the x and y axis are displayed simultaneously. The cameras may be left on during the test to monitor the pin alignment. Vacuum hold-down enables device testing regardless of device types and sizes.文檔
無文檔