描述
Includes full passing diagnostics on final inspection.配置
Teradyne UFlex-SC with: (3) UP1600 (4) HexVS+ (1) HDVS Tera 1 Ultra DPS2 License: 200mbps x 12 UP1600, 512MLVM x 12 UP1600, 256 Pattern memory, Scan license.OEM 代工型號說明
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.文檔
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TERADYNE
UFLEX-SC
已驗證
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
77340
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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查看全部TERADYNE
UFLEX-SC
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
77340
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Includes full passing diagnostics on final inspection.配置
Teradyne UFlex-SC with: (3) UP1600 (4) HexVS+ (1) HDVS Tera 1 Ultra DPS2 License: 200mbps x 12 UP1600, 512MLVM x 12 UP1600, 256 Pattern memory, Scan license.OEM 代工型號說明
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.文檔
無文檔