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描述
Working Condition Additional Features: Adaptor for HSD200 or HSD100配置
2048 Test Head (16 HSD slot), 1x HDCUB, Tera1, MP936 OptionalOEM 代工型號說明
The J750Ex-HD offers the lowest cost test solution for uncompromised test quality of less complex mixed signal devices. The J750Ex-HD is well-known for its ‘zero footprint’ design minimizing use of valuable manufacturing floor space. The scalability of the test system, to 2048 multifunction pins and data rates up 400 MHz/800 Mbps, makes it ideal for low-cost devices with increasing feature integration.文檔
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TERADYNE
J750EX-HD
類別
Final Test
上次驗證: 超過60天前
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條件:
Used
作業狀態:
未知
產品編號:
82938
晶圓尺寸:
未知
年份:
未知
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描述
Working Condition Additional Features: Adaptor for HSD200 or HSD100配置
2048 Test Head (16 HSD slot), 1x HDCUB, Tera1, MP936 OptionalOEM 代工型號說明
The J750Ex-HD offers the lowest cost test solution for uncompromised test quality of less complex mixed signal devices. The J750Ex-HD is well-known for its ‘zero footprint’ design minimizing use of valuable manufacturing floor space. The scalability of the test system, to 2048 multifunction pins and data rates up 400 MHz/800 Mbps, makes it ideal for low-cost devices with increasing feature integration.文檔
無文檔