描述
無描述配置
8 PE + 2 DPSOEM 代工型號說明
The J750 Family of semiconductor test systems by Teradyne is a compact and economical solution that delivers high-efficiency parallel test in a small system footprint. The J750 Family is available in 512 pin, 1024 pin, and J750k configurations, each with its own set of features and capabilities. The 512 pin and 1024 pin configurations both have a clock speed of 100 MHz, while the J750k has a clock speed of 66 MHz / 33 MHz. All configurations come with IG-XL software built on Windows and Microsoft Excel, and offer various options for memory test, converter test, mixed signal test, RFID, scan, APMU channels, high voltage drivers, and device power supplies.文檔
無文檔
TERADYNE
J750
已驗證
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
113961
晶圓尺寸:
未知
年份:
2010
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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TERADYNE
J750
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
113961
晶圓尺寸:
未知
年份:
2010
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
8 PE + 2 DPSOEM 代工型號說明
The J750 Family of semiconductor test systems by Teradyne is a compact and economical solution that delivers high-efficiency parallel test in a small system footprint. The J750 Family is available in 512 pin, 1024 pin, and J750k configurations, each with its own set of features and capabilities. The 512 pin and 1024 pin configurations both have a clock speed of 100 MHz, while the J750k has a clock speed of 66 MHz / 33 MHz. All configurations come with IG-XL software built on Windows and Microsoft Excel, and offer various options for memory test, converter test, mixed signal test, RFID, scan, APMU channels, high voltage drivers, and device power supplies.文檔
無文檔