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描述
無描述配置
無配置OEM 代工型號說明
The IP750EMP is a powerful and flexible testing system built with Teradyne’s J750 VLSI test platform, which has over 1,700 systems installed worldwide. It is an upgrade to the IP750 series systems and can be easily upgraded on-site to the IP750EP and the IP750EMP with enhanced image data processing speed to adapt to today’s rapidly changing market. The IP750EMP is designed for shorter test time, featuring a multiple-PC architecture that allows image data processing (IDP) for multiple sites to be done individually but simultaneously. This provides a flexible solution for the needs of large IDP device testing. With its advanced capabilities, the IP750EMP is a reliable and efficient choice for your testing needs.文檔
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TERADYNE
IP750EMP
類別
Final Test
上次驗證: 超過60天前
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條件:
Used
作業狀態:
未知
產品編號:
107270
晶圓尺寸:
未知
年份:
未知
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描述
無描述配置
無配置OEM 代工型號說明
The IP750EMP is a powerful and flexible testing system built with Teradyne’s J750 VLSI test platform, which has over 1,700 systems installed worldwide. It is an upgrade to the IP750 series systems and can be easily upgraded on-site to the IP750EP and the IP750EMP with enhanced image data processing speed to adapt to today’s rapidly changing market. The IP750EMP is designed for shorter test time, featuring a multiple-PC architecture that allows image data processing (IDP) for multiple sites to be done individually but simultaneously. This provides a flexible solution for the needs of large IDP device testing. With its advanced capabilities, the IP750EMP is a reliable and efficient choice for your testing needs.文檔
無文檔