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COHU / MULTITEST MT 9928
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The MULTITEST MT 9928 is a high-speed gravity handler known for its field-proven reliability and exceptional performance. Its modular and scalable design, coupled with a range of options, allows it to be configured precisely according to specific test requirements. The MT 9928 boasts an easy-access design and quick conversion kit part changes, facilitating fast and efficient package style adjustments. With a large soak capacity and outstanding temperature accuracy and stability across the entire tri-temp range, this test handler provides reliable and precise testing for various semiconductor devices.
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    類別
    Final Test

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    97845


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    COHU / MULTITEST

    MT 9928

    verified-listing-icon
    已驗證
    類別
    Final Test
    上次驗證: 超過60天前
    listing-photo-23fba0181da047289e5a4e299f604bd6-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    97845


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The MULTITEST MT 9928 is a high-speed gravity handler known for its field-proven reliability and exceptional performance. Its modular and scalable design, coupled with a range of options, allows it to be configured precisely according to specific test requirements. The MT 9928 boasts an easy-access design and quick conversion kit part changes, facilitating fast and efficient package style adjustments. With a large soak capacity and outstanding temperature accuracy and stability across the entire tri-temp range, this test handler provides reliable and precise testing for various semiconductor devices.
    文檔

    無文檔