描述
LTX Credence Semiconductor Tester, 97173001-07 PDU-Sapphire, 3300034-01 Sapphire, HD6C-25,27,29 PDU-Sapphire, 3300034-01 Power Conditioner NP Test 40152065 PCB, 97152065, SM Distribution, 97152065-02 Corcom 36FCD10 EMI Filter Panel Mount Power Line EMI RFI 3-Phase Filter, 36A, 277/480VAC ESMO, DPI, SVCSAP114, BDX-DE/ML, HSX-EP, SVCSAP114配置
無配置OEM 代工型號說明
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.文檔
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COHU / LTX-CREDENCE
SAPPHIRE
已驗證
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
64072
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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COHU / LTX-CREDENCE
SAPPHIRE
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
64072
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
LTX Credence Semiconductor Tester, 97173001-07 PDU-Sapphire, 3300034-01 Sapphire, HD6C-25,27,29 PDU-Sapphire, 3300034-01 Power Conditioner NP Test 40152065 PCB, 97152065, SM Distribution, 97152065-02 Corcom 36FCD10 EMI Filter Panel Mount Power Line EMI RFI 3-Phase Filter, 36A, 277/480VAC ESMO, DPI, SVCSAP114, BDX-DE/ML, HSX-EP, SVCSAP114配置
無配置OEM 代工型號說明
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.文檔
無文檔