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描述
無描述配置
無配置OEM 代工型號說明
The Fusion High Functionality ("HF") test head contains high pin count digital and mixed signal technology to test all aspects of a system-on-a-chip device in a single insertion. The HF test head contains 32 mixed signal slots, 64 HiPer II digital pin slots and 8 radio frequency ("RF") or power module slots, thus enabling it to test both digital and analog signals. The HF test head can be configured with up to 1,024 digital pins. The HF can support a wide range of mixed signal test solutions such as RF, smart power, precision high voltage analog channels, precise timebase analyzers, powerful DSP-based synthesizer and digitizers for high-speed and high-resolution embedded converters.文檔
無文檔
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
18282
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
COHU / LTX-CREDENCE
FUSION HF
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
18282
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
The Fusion High Functionality ("HF") test head contains high pin count digital and mixed signal technology to test all aspects of a system-on-a-chip device in a single insertion. The HF test head contains 32 mixed signal slots, 64 HiPer II digital pin slots and 8 radio frequency ("RF") or power module slots, thus enabling it to test both digital and analog signals. The HF test head can be configured with up to 1,024 digital pins. The HF can support a wide range of mixed signal test solutions such as RF, smart power, precision high voltage analog channels, precise timebase analyzers, powerful DSP-based synthesizer and digitizers for high-speed and high-resolution embedded converters.文檔
無文檔