描述
無描述配置
4 x DPIN96 (96 Channel, 100MHz, Digital Instrument w/16M Vector Memory) 1 x DMSDIG (4 Channel Audio-Video Digitizer) 1 x DMSAWG (8 Channel Audio-Video Arbitrary Waveform Generator) 1 x DIBU (DIB Utility Instrument) 1 x Pegasus Manipulator 1 x Computer Operating System: Linux Software: DMD V2.1.1.4OEM 代工型號說明
The LTX-Credence Diamond 10 is a versatile and cost-effective test system designed for testing a wide variety of consumer and industrial integrated circuit (IC) devices. It is particularly well-suited for cost-sensitive environments where efficiency is crucial. The Diamond 10's compact size and low power consumption make it a practical choice for both laboratory and cleanroom settings, providing a flexible and efficient solution for IC testing needs.文檔
無文檔
COHU / LTX-CREDENCE
DIAMOND 10
已驗證
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
101163
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
類似上架商品
查看全部
COHU / LTX-CREDENCE
DIAMOND 10
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
101163
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
4 x DPIN96 (96 Channel, 100MHz, Digital Instrument w/16M Vector Memory) 1 x DMSDIG (4 Channel Audio-Video Digitizer) 1 x DMSAWG (8 Channel Audio-Video Arbitrary Waveform Generator) 1 x DIBU (DIB Utility Instrument) 1 x Pegasus Manipulator 1 x Computer Operating System: Linux Software: DMD V2.1.1.4OEM 代工型號說明
The LTX-Credence Diamond 10 is a versatile and cost-effective test system designed for testing a wide variety of consumer and industrial integrated circuit (IC) devices. It is particularly well-suited for cost-sensitive environments where efficiency is crucial. The Diamond 10's compact size and low power consumption make it a practical choice for both laboratory and cleanroom settings, providing a flexible and efficient solution for IC testing needs.文檔
無文檔