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描述
DMDXAMS082218-1115 1 Base System with 20 Slot Test Head 1 Workstation - PC-D1 1 208VAC 1 Digit Multimeter - 34401A 2 DPIN96 Digital 96ch 100MHz 64M Vector Depth 1 SDU System & DUT Utility Board 12 Air Management Baffle 1 Standard 22 Inch LCD Monitor 1 Parallel/TTL Handler Inteface Card for CPU 1 System Test Interface配置
Workstation: PC-D1 DMM: 34401 Test Head: 1 Part No. -SDU: 1 DPIN96-64 -License 32M: 8 -License 64M: DPS16: 2 Others -PIB+Tower+PIB Stiffener: 1 -Manipulator: 1 -Docking kit: 2 -TTL cable: 1 -GPIB cable: 1OEM 代工型號說明
The LTX-Credence Diamondx Tester is a versatile and air-cooled platform designed to efficiently test the complete signal chain, covering power, RF, and MCU (Microcontroller Unit) devices. It offers a universal testing capability, enabling comprehensive assessments of different types of semiconductor devices without unnecessary platform overhead.文檔
無文檔
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
101549
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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COHU / LTX-CREDENCE
DIAMONDx
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
101549
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
DMDXAMS082218-1115 1 Base System with 20 Slot Test Head 1 Workstation - PC-D1 1 208VAC 1 Digit Multimeter - 34401A 2 DPIN96 Digital 96ch 100MHz 64M Vector Depth 1 SDU System & DUT Utility Board 12 Air Management Baffle 1 Standard 22 Inch LCD Monitor 1 Parallel/TTL Handler Inteface Card for CPU 1 System Test Interface配置
Workstation: PC-D1 DMM: 34401 Test Head: 1 Part No. -SDU: 1 DPIN96-64 -License 32M: 8 -License 64M: DPS16: 2 Others -PIB+Tower+PIB Stiffener: 1 -Manipulator: 1 -Docking kit: 2 -TTL cable: 1 -GPIB cable: 1OEM 代工型號說明
The LTX-Credence Diamondx Tester is a versatile and air-cooled platform designed to efficiently test the complete signal chain, covering power, RF, and MCU (Microcontroller Unit) devices. It offers a universal testing capability, enabling comprehensive assessments of different types of semiconductor devices without unnecessary platform overhead.文檔
無文檔