
描述
Keysight Medalist i3070 Series 5 2-Module In-Circuit Test System, p/n E9902E (TH E9998E), 12MHz advanced combinational, 100-415V, 50/60Hz, 3ph, w/ enabled features: simple express fixturing, incircuit test, functional test, timing test, boundary-scan, advanced boundary-scan, advanced boundary-scan differential, advanced I/O boundary scan, PanelTest, throughput multiplier, testjet, polarity check, connect check, powered testing, software revision B, fault detective, Flash70, awaretest, control XT override, advanced fixturing, silicon nails, flash ISP, PLD ISP, external application DLL. Module 4 config: 64Mb RAM, 1x NASRU, 8x HAdvDD2, 1x CtlXtpA, 1x Access.配置
無配置OEM 代工型號說明
Medalist i3070 Series 5 In-Circuit Test System The Medalist i3070 Series 5 Board Test Family is the broadest and most compatible family of board test systems available on the market today . Designed to handle a wide variety of test strategies, technologies, printed circuit boards (PCBs), and budgets, the Medalist i3070 Series 5 family offers a specific test system to fit your exact requirements. The systems can be expanded in both hardware and software capabilities to meet future growth needs文檔
無文檔
類別
Final Test
上次驗證: 18 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
137026
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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i3070 SERIES 5
類別
Final Test
上次驗證: 18 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
137026
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Keysight Medalist i3070 Series 5 2-Module In-Circuit Test System, p/n E9902E (TH E9998E), 12MHz advanced combinational, 100-415V, 50/60Hz, 3ph, w/ enabled features: simple express fixturing, incircuit test, functional test, timing test, boundary-scan, advanced boundary-scan, advanced boundary-scan differential, advanced I/O boundary scan, PanelTest, throughput multiplier, testjet, polarity check, connect check, powered testing, software revision B, fault detective, Flash70, awaretest, control XT override, advanced fixturing, silicon nails, flash ISP, PLD ISP, external application DLL. Module 4 config: 64Mb RAM, 1x NASRU, 8x HAdvDD2, 1x CtlXtpA, 1x Access.配置
無配置OEM 代工型號說明
Medalist i3070 Series 5 In-Circuit Test System The Medalist i3070 Series 5 Board Test Family is the broadest and most compatible family of board test systems available on the market today . Designed to handle a wide variety of test strategies, technologies, printed circuit boards (PCBs), and budgets, the Medalist i3070 Series 5 family offers a specific test system to fit your exact requirements. The systems can be expanded in both hardware and software capabilities to meet future growth needs文檔
無文檔