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ADVANTEST T5377
    描述
    Memory Tester
    配置
    Memory Tester
    OEM 代工型號說明
    The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.
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    ADVANTEST

    T5377

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    已驗證

    類別

    Final Test
    上次驗證: 超過60天前
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    90935


    晶圓尺寸:

    未知


    年份:

    2004

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    Money Back Guarantee
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    Transaction Insured by Moov
    Available
    Refurbishment Services
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    類似上架商品
    查看全部
    ADVANTEST T5377
    ADVANTESTT5377Final Test
    年份: 2003條件: 二手
    上次驗證超過60天前

    ADVANTEST

    T5377

    verified-listing-icon

    已驗證

    類別

    Final Test
    上次驗證: 超過60天前
    listing-photo-44803270a3ba41c1851d4f1ccbe1210f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    90935


    晶圓尺寸:

    未知


    年份:

    2004


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Memory Tester
    配置
    Memory Tester
    OEM 代工型號說明
    The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.
    文檔

    無文檔

    類似上架商品
    查看全部
    ADVANTEST T5377
    ADVANTEST
    T5377
    Final Test年份: 2003條件: 二手上次驗證: 超過60天前
    ADVANTEST T5377
    ADVANTEST
    T5377
    Final Test年份: 0條件: 二手上次驗證: 超過60天前
    ADVANTEST T5377
    ADVANTEST
    T5377
    Final Test年份: 2004條件: 二手上次驗證: 超過60天前