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SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
  • SEMILAB SE-3000
描述
無描述
配置
無配置
OEM 代工型號說明
Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity
文檔
文件圖示

SOPRA frame SE300.pdf

SEMILAB

SE-3000

verified-listing-icon

已驗證

類別
Elipsometry

上次驗證: 超過60天前

關鍵商品詳情
條件:

Used

作業狀態:

未知

產品編號:

84893

晶圓尺寸:

12"/300mm

年份:

2004

Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
類似上架商品
查看全部
SEMILAB SE-3000

SEMILAB

SE-3000

Elipsometry
年份: 2004條件: 二手
上次驗證超過60天前

SEMILAB

SE-3000

verified-listing-icon
已驗證
類別
Elipsometry
上次驗證: 超過60天前
listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/a2cda83d16404a269edfdfe64a73056e_7a1abc1cab804d11b2363a26987355bd_mw.jpeg
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listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/b9267f7969884871a78fe9bc8f1a99f5_abb494cf22a74e4db4b590742119356a_mw.jpeg
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listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/865858dbd27a4d008e30feffac08e0f7_3c5ff27725794b228339e8975a2d824c1201a_mw.jpeg
關鍵商品詳情
條件:

Used

作業狀態:

未知

產品編號:

84893

晶圓尺寸:

12"/300mm

年份:

2004

Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述
配置
無配置
OEM 代工型號說明
Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity
文檔
文件圖示

SOPRA frame SE300.pdf

類似上架商品
查看全部
SEMILAB SE-3000

SEMILAB

SE-3000

Elipsometry年份: 2004條件: 二手上次驗證:超過60天前