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SEMILAB SE-3000
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity
    文檔
    文件圖示

    SOPRA frame SE300.pdf

    SEMILAB

    SE-3000

    verified-listing-icon

    已驗證

    類別
    Elipsometry

    上次驗證: 超過60天前

    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    84893

    晶圓尺寸:

    12"/300mm

    年份:

    2004

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    SEMILAB SE-3000

    SEMILAB

    SE-3000

    Elipsometry
    年份: 2004條件: 二手
    上次驗證超過60天前

    SEMILAB

    SE-3000

    verified-listing-icon
    已驗證
    類別
    Elipsometry
    上次驗證: 超過60天前
    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/a2cda83d16404a269edfdfe64a73056e_7a1abc1cab804d11b2363a26987355bd_mw.jpeg
    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/da35ed5e19af43f9ae2f3f2bd3b2482d_a319c9493a0c4ea0b2b66b9da27c36dd_mw.jpeg
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    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/3e4d17a45f184b65b1c00c5189af7403_92064762282546549b002a741bee612d_mw.jpeg
    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/b9267f7969884871a78fe9bc8f1a99f5_abb494cf22a74e4db4b590742119356a_mw.jpeg
    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/58a6ace9ff324b8182853a9446532a37_f3cbe3b50068410daac7b3b18744d420_mw.jpeg
    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/6dcc90a1e77445748a163eeaac47b9d2_77d13ad3a6f94ee786aacf4c433e32d645005c_mw.jpeg
    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/865858dbd27a4d008e30feffac08e0f7_3c5ff27725794b228339e8975a2d824c1201a_mw.jpeg
    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    84893

    晶圓尺寸:

    12"/300mm

    年份:

    2004

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity
    文檔
    文件圖示

    SOPRA frame SE300.pdf

    類似上架商品
    查看全部
    SEMILAB SE-3000

    SEMILAB

    SE-3000

    Elipsometry年份: 2004條件: 二手上次驗證:超過60天前