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ONTO / RUDOLPH / AUGUST FOCUS FE VII
    描述
    Description Qty MAIN FRAME 1 69*48*53
    配置
    PROGRESS TYPE: METROLOGY COMPONENT : MAINFRAME STAND MONITOR
    OEM 代工型號說明
    FOCUS FE VII system is designed for high volume, sub-micron device manufacturing requiring superior film thickness and index of refraction measurements in diffusion, etch, CMP and CVD applications.
    文檔

    無文檔

    類別
    Elipsometry

    上次驗證: 8 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    127796


    晶圓尺寸:

    8"/200mm


    年份:

    1999


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    ONTO / RUDOLPH / AUGUST

    FOCUS FE VII

    verified-listing-icon
    已驗證
    類別
    Elipsometry
    上次驗證: 8 天前
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    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    127796


    晶圓尺寸:

    8"/200mm


    年份:

    1999


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Description Qty MAIN FRAME 1 69*48*53
    配置
    PROGRESS TYPE: METROLOGY COMPONENT : MAINFRAME STAND MONITOR
    OEM 代工型號說明
    FOCUS FE VII system is designed for high volume, sub-micron device manufacturing requiring superior film thickness and index of refraction measurements in diffusion, etch, CMP and CVD applications.
    文檔

    無文檔