描述

Stanford Research SR760 FFT Spectrum Analyzer Features: -DC to 100 kHz bandwidth -90 dB dynamic range -Harmonic, band & sideband analysis -Hardcopy output to printers & plotters -3.5" DOS compatible disk drive -GPIB and RS-232 Interface Description: The SR760 is a single-channel 100 kHz FFT spectrum analyzer with a dynamic range of 90 dB and a real-time bandwidth of 100 kHz. The speed and dynamic range of these instruments, coupled with their flexibility and many analysis modes, makes them the ideal choice for a variety of applications including acoustics, vibration, noise measurement, and general electronic use.

配置

The Unit's Serial Number Tag Reads: Serial Number: 14021 Specifications: Frequency: Measurement Range: 476 µHz to 100 kHz Spans: 191 mHz to 100 kHz (in a binary sequence) Center Frequency: Anywhere within the 0 to 100 kHz measurement range Accuracy: 25 ppm from 20°C to 40°C Resolution: Span/400 Window Functions: Blackman-Harris, Hanning, Flat-Top and Uniform Real-time Bandwidth: 100 kHz Signal Input: Number of Channels: 1 Input: Single-ended or differential Input Impedance: 1 MΩ, 15 pF Coupling: AC or DC CMRR (at 1 kHz): 90 dB (input range > -6 dBV), 80 dB (input range < 14 dBV), 50 dB (input range ≥ 14 dBV) Noise: Typical: 5 nVrms/√Hz at 1 kHz (-166 dBVrms/√Hz) Maximum: 10 nVrms/√Hz (-160 dBVrms/√Hz) Amplitude: Full-scale Input Range: -60 dBV (1.0 mVp) to +34 dBV (50 Vp) in 2 dB steps Dynamic Range: 90 dB (typ.) Harmonic Distortion: No greater than -80 dB from DC to 100 kHz (input range 0 dBV) Spurious: No greater than -85 dB below full scale (< 200 Hz). No greater than -90 dB below full scale (to 100 kHz)(-50 dBV input range) Input Sampling: 16-bit A/D at 256 kHz Accuracy: ±0.3 dB ±0.02% of full scale (excluding windowing effects) Averaging: RMS, Vector and Peak Hold. Lienar and exponential averaging up to 64k scans. Trigger Inputs: Modes: Continuous, internal, external, TTL Internal Level: Adjustable to ±100% of input scale. (Positive or negative slope) Min. Trigger Amplitude: 10% of input range External Level: ±5 V in 40 mV steps, 10 kΩ impedance (positive or negative slop) Min. Trigger Amplitude: 100 mV External TTL: Requires TTL level (low < 0.7 V, high > 2 V Post-Trigger: Measurement record is delayed by 1 to 65,000 samples (1/512 to 127 time records) after the trigger. Delay resolution is 1 sample (1/512 a record). Pre-Trigger: Measurement record starts up to 51.953 ms prior to the trigger. Delay resolution is 3.9062 ms. Phase Indeterminacy: < 2° Display Functions: Display: Real, imaginary, magnitude or phase. Measurements: Spectrum, power spectral density, time record and 1/3 octave Analysis: Band, sideband, total harmonic distortion and trace math Graphic Expand: Display expand up to x50 about any point Harmonic Marker: Displays up to 400 harmonics Data Tables: Lists Y values of up to 200 points Limit Tables: Detects data exceeding up to 100 user-defined upper and lower limit trace segments. General: Monitor: Monochrome CRT, 640 H by 480V resolution, adjustable brightness and position Interfaces: IEEE-488.2, RS-232 and Printer interfaces standard. An XT keyboard input is provided for additional flexibility. Hardcopy: Screen dumps and table and setting listings to dot matrix and LaserJet compatible printers. Data plots to HP-GL compatible plotters (RS-232 or IEEE-488.2) Disk: 3.5" DOS compatible format, 720 kbyte capacity. Stores data and instrument configurations. Power: 60 W, 100/120/220/240 VAC, 50/60 Hz Dimensions: 17" W x 6.25" H x 18.5" D Weight: 36 lbs.