描述

Metrology / inspection system

配置

Meas System Automated Wafer Handling (Qty 2) FOUP Factory Interface Process: Wafer Inspection Tool Software Version: TC*1.15.5/10.2.00 CIM: SECS/GEM

OEM 代工型號說明

未提供

文檔

無文檔

HSEB / ZEISS

ODIN-A30

已驗證

類別

Defect Inspection

上次驗證: 6 天前

關鍵商品詳情

條件:

Used

作業狀態:

未知

產品編號:

154827

晶圓尺寸:

12"/300mm

年份:

2012

Logistics Support

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

類似上架商品

查看全部

HSEB / ZEISS

ODIN-A30

Defect Inspection

年份: 2012條件: 二手

上次驗證6 天前

HSEB / ZEISS

ODIN-A30

已驗證

類別

Defect Inspection

上次驗證: 6 天前

listing-photo-6c35c000cbdb4583a4c85027a69fd406-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png

關鍵商品詳情

條件:

Used

作業狀態:

未知

產品編號:

154827

晶圓尺寸:

12"/300mm

年份:

2012

Logistics Support

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

描述

Metrology / inspection system

配置

Meas System Automated Wafer Handling (Qty 2) FOUP Factory Interface Process: Wafer Inspection Tool Software Version: TC*1.15.5/10.2.00 CIM: SECS/GEM

OEM 代工型號說明

未提供

文檔

無文檔

類似上架商品

查看全部

HSEB / ZEISS

ODIN-A30

Defect Inspection年份: 2012條件: 二手上次驗證:6 天前