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描述
Semilab WT-2020 (u-PCR) Carrier life time measurement配置
■ System Configuration . WT2020 main unit with scanning capability . Dual PC : DOS PC & Window PC . μ-PCR head for lifetime measurements . Application S/W : WSOS2 ( DOS PC ), Wintau 32 ( Windows PC ) . Vacuum pump . Utility : - Power : 220V or 115V, 50/60Hz - Vacuum : 1/4" 0.2 ~0.5 bar ■ Hadware Function Capability . μ-PCD measurement (904 nm Laser) . Laser Power Feedback . AUX Laser (Option) : 500 mW, 349nm . Others ■ Application . Monitoring defects and contamination ( bulk and surface region of Si wafer) . Characterization of thin film samples ■ Measurement . Carrier Lifetime Measurement ( μ-PCD/μ-PCD ) . High resolution mapping and discrete point measurements . Characterization of thin film samplesOEM 代工型號說明
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SEMILAB
WT-2020
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
66030
晶圓尺寸:
8"/200mm
年份:
2018
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描述
Semilab WT-2020 (u-PCR) Carrier life time measurement配置
■ System Configuration . WT2020 main unit with scanning capability . Dual PC : DOS PC & Window PC . μ-PCR head for lifetime measurements . Application S/W : WSOS2 ( DOS PC ), Wintau 32 ( Windows PC ) . Vacuum pump . Utility : - Power : 220V or 115V, 50/60Hz - Vacuum : 1/4" 0.2 ~0.5 bar ■ Hadware Function Capability . μ-PCD measurement (904 nm Laser) . Laser Power Feedback . AUX Laser (Option) : 500 mW, 349nm . Others ■ Application . Monitoring defects and contamination ( bulk and surface region of Si wafer) . Characterization of thin film samples ■ Measurement . Carrier Lifetime Measurement ( μ-PCD/μ-PCD ) . High resolution mapping and discrete point measurements . Characterization of thin film samplesOEM 代工型號說明
未提供文檔
無文檔