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NIKON OPTISTATION-3000
    描述
    無描述
    配置
    Semi-Auto (Auto wafer handler),12" only. Specifications Wafer size: 300 mm (SEMI / M1.15 /t = 750 -20 um), Standard cassette types: FOUP, FOSB, and FFO Micro inspection: Surface, backside, edge, and macro image capture functions Wafer alignment: Non-contact alignment Wafer transfer system: High-speed, multi-axis robot Microscope: Nikon L300 300mm wafer inspection microscope (brightfield/darkfield and DIC observation) Expandability: 200mm wafer transfer, deformed wafer transfer, and thin wafer transfer Power usage: Power supply: 200 VAC -10%, max. 10A, 50/60 Hz Vacuum: -66.7 kPa/-30 NI/min Stage: Manual vacuum contact stage with 360° rotation System reliability: MTBF 1500 hours, Up time > 95%
    OEM 代工型號說明
    OPTISTATION-3000 wafer inspection system.
    文檔
    文件圖示

    NIKON OPTISTATION-3000.pdf

    NIKON

    OPTISTATION-3000

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    已驗證

    類別

    Defect Inspection
    上次驗證: 超過60天前
    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    66601

    晶圓尺寸:

    未知

    年份:

    未知

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    NIKON OPTISTATION-3000
    NIKONOPTISTATION-3000Defect Inspection
    年份: 0條件: 二手
    上次驗證超過60天前
    NIKON OPTISTATION-3000
    NIKONOPTISTATION-3000Defect Inspection
    年份: 0條件: 二手
    上次驗證超過60天前

    NIKON

    OPTISTATION-3000

    verified-listing-icon

    已驗證

    類別

    Defect Inspection
    上次驗證: 超過60天前
    listing-photo-5ed50e72b0b941c58544e91d0670f7e2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1806/5ed50e72b0b941c58544e91d0670f7e2/66c70825499c44f888045b07498613f8_33b6662e0cb34550abafe459af47363445005c_mw.jpeg
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    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    66601

    晶圓尺寸:

    未知

    年份:

    未知

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    Semi-Auto (Auto wafer handler),12" only. Specifications Wafer size: 300 mm (SEMI / M1.15 /t = 750 -20 um), Standard cassette types: FOUP, FOSB, and FFO Micro inspection: Surface, backside, edge, and macro image capture functions Wafer alignment: Non-contact alignment Wafer transfer system: High-speed, multi-axis robot Microscope: Nikon L300 300mm wafer inspection microscope (brightfield/darkfield and DIC observation) Expandability: 200mm wafer transfer, deformed wafer transfer, and thin wafer transfer Power usage: Power supply: 200 VAC -10%, max. 10A, 50/60 Hz Vacuum: -66.7 kPa/-30 NI/min Stage: Manual vacuum contact stage with 360° rotation System reliability: MTBF 1500 hours, Up time > 95%
    OEM 代工型號說明
    OPTISTATION-3000 wafer inspection system.
    文檔
    文件圖示

    NIKON OPTISTATION-3000.pdf

    類似上架商品
    查看全部
    NIKON OPTISTATION-3000
    NIKON
    OPTISTATION-3000
    Defect Inspection年份: 0條件: 二手上次驗證: 超過60天前
    NIKON OPTISTATION-3000
    NIKON
    OPTISTATION-3000
    Defect Inspection年份: 0條件: 二手上次驗證: 超過60天前