描述
無描述配置
Wafer Patt InspectorOEM 代工型號說明
The Optistation 7 IC Wafer Inspection System Dual, a 300mm fabrication compliant unit featuring a feeder arm transfer unit offering high throughput with a new macro illumination system allowing for thin film observation and defocus detection as well as detection of particulates and scratches on both front and backside.文檔
無文檔
NIKON
OPTISTATION 7
已驗證
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
71209
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
NIKON
OPTISTATION 7
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
71209
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
Wafer Patt InspectorOEM 代工型號說明
The Optistation 7 IC Wafer Inspection System Dual, a 300mm fabrication compliant unit featuring a feeder arm transfer unit offering high throughput with a new macro illumination system allowing for thin film observation and defocus detection as well as detection of particulates and scratches on both front and backside.文檔
無文檔