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KLA / VISTEC / LEICA INS3000
    描述
    Microscope No missing parts Current Wafer size : 8
    配置
    Loader System 1) apply to one size (4”,5”,6” or 8”) 2) Indexer2200,2 cassette station(8”) 3) Auto transfer, auto evacuation and auto loading Pre-aligner 1) work for wafer with notch or flat 2) ensure wafer in the center of microscopic stage Vibration Decoupling 1) effect in the three axis with a height controlled air cushioning system Wobbler (Optional) 1)For macroscopic inspection of the wafer before microscopic inspection Image mode 1)Bright/Dark field Eyepiece 1)HC PLAN 10X Objective 1)5x/0.12 PL FLUOTAR 2)10x/0.30 BD HC PL FLUOTAR 3) 50x/0.80 BD HC PL FLUOTAR 4) 100x/0.90 BD HC PL FLUOTAR 5) 150x/0.90 BD PL APO Auto Beam splitter 1)Motor-Driven Beam splitter LFS 1)autofocus,record z and laser offset Light Intensity 1) store in the inspection program, change with objective 2) adjust intensity through the control bar Diaphragm Module 1) Motor-Driven, programmed for every position on the revolving nosepiece 2) 5 integrate pinhole aperture Stage 1) Use joystick to move the stage 2) Hardware object protection Item Specification Transport method Vacuum transport Cleanroom classification Class 1 FED Std 209d Wafer sizes 100m/125mm/150mm/200mm Number of Cassettes 2 Cassette type SEMI standard Prealignment Contract free Marco defect control Optional wobbler with illumination device User interface Windows NT based inspection & review software VISCON NT Interface Interface for RS 232,SECS,Ethernet Interface SMIF adaption 2 indexer Required vacuum <200 hpa Required compressed air 3.5 bar(max. 6 bar) Power requirements AC 115V/60Hz,230V/50Hz,single phase Max Load 10A Footprint(2 cassette) 1440x900mm Weight(2 cassette) 550kg(1210lbs) Temperature 18 to 25℃,±1° 64 to 78℉,±1° Humidity Max.75% RH Noise generation 70 Db(A)
    OEM 代工型號說明
    The Leica INS 3000 is the new defect review and inspection station. The all stainless-steel system features a fully automatic integrated microscope, including UV and Confocal, and universal wafer handler. The design priorities of the INS 3000 are ergonomy, cleanliness, automation and user-friendliness.The characteristics of the system are 1 to 3 cassette front loading, including SMIF, and a newly developed Windows™ NT based graphical user interface.
    文檔

    KLA / VISTEC / LEICA

    INS3000

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Deinstalled


    產品編號:

    107109


    晶圓尺寸:

    4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm


    年份:

    1999


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    KLA / VISTEC / LEICA INS3000

    KLA / VISTEC / LEICA

    INS3000

    Defect Inspection
    年份: 0條件: 二手
    上次驗證超過60天前

    KLA / VISTEC / LEICA

    INS3000

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過60天前
    listing-photo-fc7513e36bee4b73b032ef42a5092ab6-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Deinstalled


    產品編號:

    107109


    晶圓尺寸:

    4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm


    年份:

    1999


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Microscope No missing parts Current Wafer size : 8
    配置
    Loader System 1) apply to one size (4”,5”,6” or 8”) 2) Indexer2200,2 cassette station(8”) 3) Auto transfer, auto evacuation and auto loading Pre-aligner 1) work for wafer with notch or flat 2) ensure wafer in the center of microscopic stage Vibration Decoupling 1) effect in the three axis with a height controlled air cushioning system Wobbler (Optional) 1)For macroscopic inspection of the wafer before microscopic inspection Image mode 1)Bright/Dark field Eyepiece 1)HC PLAN 10X Objective 1)5x/0.12 PL FLUOTAR 2)10x/0.30 BD HC PL FLUOTAR 3) 50x/0.80 BD HC PL FLUOTAR 4) 100x/0.90 BD HC PL FLUOTAR 5) 150x/0.90 BD PL APO Auto Beam splitter 1)Motor-Driven Beam splitter LFS 1)autofocus,record z and laser offset Light Intensity 1) store in the inspection program, change with objective 2) adjust intensity through the control bar Diaphragm Module 1) Motor-Driven, programmed for every position on the revolving nosepiece 2) 5 integrate pinhole aperture Stage 1) Use joystick to move the stage 2) Hardware object protection Item Specification Transport method Vacuum transport Cleanroom classification Class 1 FED Std 209d Wafer sizes 100m/125mm/150mm/200mm Number of Cassettes 2 Cassette type SEMI standard Prealignment Contract free Marco defect control Optional wobbler with illumination device User interface Windows NT based inspection & review software VISCON NT Interface Interface for RS 232,SECS,Ethernet Interface SMIF adaption 2 indexer Required vacuum <200 hpa Required compressed air 3.5 bar(max. 6 bar) Power requirements AC 115V/60Hz,230V/50Hz,single phase Max Load 10A Footprint(2 cassette) 1440x900mm Weight(2 cassette) 550kg(1210lbs) Temperature 18 to 25℃,±1° 64 to 78℉,±1° Humidity Max.75% RH Noise generation 70 Db(A)
    OEM 代工型號說明
    The Leica INS 3000 is the new defect review and inspection station. The all stainless-steel system features a fully automatic integrated microscope, including UV and Confocal, and universal wafer handler. The design priorities of the INS 3000 are ergonomy, cleanliness, automation and user-friendliness.The characteristics of the system are 1 to 3 cassette front loading, including SMIF, and a newly developed Windows™ NT based graphical user interface.
    文檔
    類似上架商品
    查看全部
    KLA / VISTEC / LEICA INS3000

    KLA / VISTEC / LEICA

    INS3000

    Defect Inspection年份: 0條件: 二手上次驗證:超過60天前
    KLA / VISTEC / LEICA INS3000

    KLA / VISTEC / LEICA

    INS3000

    Defect Inspection年份: 0條件: 二手上次驗證:昨日
    KLA / VISTEC / LEICA INS3000

    KLA / VISTEC / LEICA

    INS3000

    Defect Inspection年份: 0條件: 二手上次驗證:29 天前