描述
Wafer Handling System for a Leica INS 2000 Defect Review System No Microscope is Included Cassette to Cassette Wafer Handling for up to 200mm Wafers SMC Digital Pressure Sensor 120V/230V, 50/60 Hz, P Max 400 VA CE Marked配置
無配置OEM 代工型號說明
未提供文檔
無文檔
KLA / VISTEC / LEICA
INS2000
已驗證
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
14788
晶圓尺寸:
8"/200mm
年份:
1996
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
類似上架商品
查看全部
KLA / VISTEC / LEICA
INS2000
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
14788
晶圓尺寸:
8"/200mm
年份:
1996
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Wafer Handling System for a Leica INS 2000 Defect Review System No Microscope is Included Cassette to Cassette Wafer Handling for up to 200mm Wafers SMC Digital Pressure Sensor 120V/230V, 50/60 Hz, P Max 400 VA CE Marked配置
無配置OEM 代工型號說明
未提供文檔
無文檔