Wafer Handling System for a Leica INS 2000 Defect Review System
No Microscope is Included
Cassette to Cassette Wafer Handling for up to 200mm Wafers
SMC Digital Pressure Sensor
120V/230V, 50/60 Hz, P Max 400 VA
CE Marked

KLA-Tencor Corporation announced that it has completed its acquisition of the Microelectronic Inspection Equipment (MIE) business unit of Vistec Semiconductor Systems. 
Vistec Semiconductor Systems - MIE provides advanced semiconductor mask and wafer manufacturing systems. 

On February of 2006, Leica Microsystems' Semiconductor Equipment Division has a new name: Vistec Semiconductor Systems. The name change is a result Golden Gate Capital takeover of Leica's semiconductor business.

描述

配置

OEM 代工型號說明

文檔

INS2000

Defect Inspection

關鍵商品詳情

類似上架商品

INS2000

Defect Inspection

關鍵商品詳情

描述

配置

OEM 代工型號說明

文檔

類似上架商品

INS2000

INS2000

INS2000

INS2000