描述
Complete and in working condition. It is still connected to facilities to maintain vacuum, but is not being used currently.配置
Standard configuration. 300mm, two FOUP.OEM 代工型號說明
The eDR7380 high performance electron-beam (e-beam) wafer defect review and classification system produces a comprehensive defect pareto in one test for accurate defect sourcing and faster excursion detection during production. Unique synergy with our inspectors facilitates accurate identification and classification of patterned wafer, bare wafer and bevel edge defects for faster yield learning during IC and wafer manufacturing.文檔
無文檔
KLA
eDR-7380
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
131743
晶圓尺寸:
12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Complete and in working condition. It is still connected to facilities to maintain vacuum, but is not being used currently.配置
Standard configuration. 300mm, two FOUP.OEM 代工型號說明
The eDR7380 high performance electron-beam (e-beam) wafer defect review and classification system produces a comprehensive defect pareto in one test for accurate defect sourcing and faster excursion detection during production. Unique synergy with our inspectors facilitates accurate identification and classification of patterned wafer, bare wafer and bevel edge defects for faster yield learning during IC and wafer manufacturing.文檔
無文檔