描述
No missing parts.配置
無配置OEM 代工型號說明
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.文檔
無文檔
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
47112
晶圓尺寸:
未知
年份:
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA CS1
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
47112
晶圓尺寸:
未知
年份:
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
No missing parts.配置
無配置OEM 代工型號說明
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.文檔
無文檔