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KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
描述
No missing parts.
配置
無配置
OEM 代工型號說明
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.
文檔

無文檔

KLA

CANDELA CS1

verified-listing-icon

已驗證

類別
Defect Inspection

上次驗證: 超過60天前

關鍵商品詳情
條件:

Used

作業狀態:

未知

產品編號:

47112

晶圓尺寸:

未知

年份:

2007

Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
類似上架商品
查看全部
KLA CANDELA CS1

KLA

CANDELA CS1

Defect Inspection
年份: 2007條件: 二手
上次驗證超過60天前

KLA

CANDELA CS1

verified-listing-icon
已驗證
類別
Defect Inspection
上次驗證: 超過60天前
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/c354f3ddbe164866b26dd1c340c29361_913b85810e0e44669381c054e7a872931105c_mw.jpeg
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/582d3e25e01f4da480322a76b22300e0_b930d6a8603d423b94a2699cce5273bc1201a_mw.jpeg
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listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/31e0b441f72e40d59cd25725c0bae72a_99a0d6e1c0e04902aa7a738d37c640581105c_mw.jpeg
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/80bb7dff47244bef82d6c5a5646115e7_0e1585aaf4f64ddd889092b9360c7f801105c_mw.jpeg
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/39d779b945fd40abaa16769e8f969bbd_a655698ffaea4c3aa88b203512e2f1861105c_mw.jpeg
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/cf2e72f51bfe43b79cb148822390c49f_4f6ddaba8d114c9c91acbf1432c8d1bf1105c_mw.jpeg
關鍵商品詳情
條件:

Used

作業狀態:

未知

產品編號:

47112

晶圓尺寸:

未知

年份:

2007

Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
No missing parts.
配置
無配置
OEM 代工型號說明
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.
文檔

無文檔

類似上架商品
查看全部
KLA CANDELA CS1

KLA

CANDELA CS1

Defect Inspection年份: 2007條件: 二手上次驗證:超過60天前