描述
無描述配置
無配置OEM 代工型號說明
The Candela 8520 is a surface inspection system that uses proprietary optical technology to measure scatter intensity at two angles of incidence. It detects and classifies a broad range of defects on Wide Band Gap materials including SiC and GaN, up to 200mm in diameter. It is used for substrate quality control, vendor comparison, process control, and tool monitoring in the SiC and GaN power device industries. Options include SECS-GEM, light tower, diamond scribe, calibration standards, offline software, OCR, and photoluminescence.文檔
無文檔
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
132009
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA 8520
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
132009
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
The Candela 8520 is a surface inspection system that uses proprietary optical technology to measure scatter intensity at two angles of incidence. It detects and classifies a broad range of defects on Wide Band Gap materials including SiC and GaN, up to 200mm in diameter. It is used for substrate quality control, vendor comparison, process control, and tool monitoring in the SiC and GaN power device industries. Options include SECS-GEM, light tower, diamond scribe, calibration standards, offline software, OCR, and photoluminescence.文檔
無文檔