描述
Wafer inspection system配置
Power requirements: 208 V 50/60 Hz CE markedOEM 代工型號說明
In October 2009, KLA launched the 8900 defect inspection system, a new tool for the CMOS Image Sensor market. The 8900 is designed to enable capture of a wide variety of defect types, with adjustable sensitivity and throughput settings for cost-effective defect management from initial product development through volume production of color filter arrays.文檔
無文檔
KLA
8900
類別
Defect Inspection
上次驗證: 10 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
153416
晶圓尺寸:
8"/200mm, 12"/300mm
年份:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Wafer inspection system配置
Power requirements: 208 V 50/60 Hz CE markedOEM 代工型號說明
In October 2009, KLA launched the 8900 defect inspection system, a new tool for the CMOS Image Sensor market. The 8900 is designed to enable capture of a wide variety of defect types, with adjustable sensitivity and throughput settings for cost-effective defect management from initial product development through volume production of color filter arrays.文檔
無文檔