描述
KLA Advanced Macro Inspection Module配置
Macro InspectionOEM 代工型號說明
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.文檔
無文檔
KLA
2900
已驗證
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
91270
晶圓尺寸:
12"/300mm
年份:
2011
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
2900
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
91270
晶圓尺寸:
12"/300mm
年份:
2011
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
KLA Advanced Macro Inspection Module配置
Macro InspectionOEM 代工型號說明
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.文檔
無文檔