描述
KLA Advanced Macro Inspection Module配置
Macro InspectionOEM 代工型號說明
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.文檔
無文檔
KLA
2900
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
91270
晶圓尺寸:
12"/300mm
年份:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
KLA Advanced Macro Inspection Module配置
Macro InspectionOEM 代工型號說明
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.文檔
無文檔