描述
Tencor Viper 2410 Macro Defect Inspection - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- critical macro after-develop inspection defect types, including hotspots, scratches, large particles, extra and missing resist, unexposed fields, striations, developer spots and splashback. - With sensitivity superior to that of operators, the 2401 Automated Macro Defect Inspection System detects defects reliably and repeatably, allowing disposition decisions to be made quickly and accurately, dramatically reducing scrap and preventing further investment in low-yielding wafers.配置
WorkingOEM 代工型號說明
未提供文檔
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KLA
VIPER 2410
已驗證
類別
Defect Inspection
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
55832
晶圓尺寸:
8"/200mm
年份:
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
VIPER 2410
已驗證
類別
Defect Inspection
上次驗證: 29 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
55832
晶圓尺寸:
8"/200mm
年份:
2001
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Tencor Viper 2410 Macro Defect Inspection - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- critical macro after-develop inspection defect types, including hotspots, scratches, large particles, extra and missing resist, unexposed fields, striations, developer spots and splashback. - With sensitivity superior to that of operators, the 2401 Automated Macro Defect Inspection System detects defects reliably and repeatably, allowing disposition decisions to be made quickly and accurately, dramatically reducing scrap and preventing further investment in low-yielding wafers.配置
WorkingOEM 代工型號說明
未提供文檔
無文檔