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KLA SURFSCAN SP2
    描述
    working condition, but no HDD
    配置
    無配置
    OEM 代工型號說明
    The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.
    文檔

    KLA

    SURFSCAN SP2

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    84587


    晶圓尺寸:

    12"/300mm


    年份:

    2006

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    KLA SURFSCAN SP2

    KLA

    SURFSCAN SP2

    Defect Inspection
    年份: 2010條件: 二手
    上次驗證超過30天前

    KLA

    SURFSCAN SP2

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過60天前
    listing-photo-24ed875185a74fa4ad79d730384cee6b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/24ed875185a74fa4ad79d730384cee6b/08a7ced9fabe4b808fbbdac163392d04_33d2f293e7d242b98632efe5db2247521201a_mw.jpeg
    listing-photo-24ed875185a74fa4ad79d730384cee6b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/24ed875185a74fa4ad79d730384cee6b/62642a34a92240a1ba533071d9749eb9_941ccf33b25644c2a075368e69c4bb64_mw.jpeg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    84587


    晶圓尺寸:

    12"/300mm


    年份:

    2006


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    working condition, but no HDD
    配置
    無配置
    OEM 代工型號說明
    The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.
    文檔
    類似上架商品
    查看全部
    KLA SURFSCAN SP2

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    Defect Inspection年份: 2010條件: 二手上次驗證: 超過30天前
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    Defect Inspection年份: 2005條件: 二手上次驗證: 超過30天前
    KLA SURFSCAN SP2

    KLA

    SURFSCAN SP2

    Defect Inspection年份: 2006條件: 二手上次驗證: 超過60天前