描述
Wafer Inspection System Details Attached配置
· Tencor 6100 Detection: 0.16 micron on Bare Silicon. · Red Laser 632 nm, matches 4500 data · Advanced Data output/GEM SECS · System Circuit Boards! · Tencor 6100OEM 代工型號說明
The Surfscan 6100 is a tool that is capable of detecting defects on a surface. It can locate, measure the size of, and count the number of defects that are as small as 0.157 micrometers in size. Additionally, it has a high capture rate of 95%, meaning it can accurately detect the vast majority of defects present on a surface.文檔
無文檔
類別
Defect Inspection
上次驗證: 10 天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
148640
晶圓尺寸:
4"/100mm, 6"/150mm, 8"/200mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
SURFSCAN 6100
類別
Defect Inspection
上次驗證: 10 天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
148640
晶圓尺寸:
4"/100mm, 6"/150mm, 8"/200mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Wafer Inspection System Details Attached配置
· Tencor 6100 Detection: 0.16 micron on Bare Silicon. · Red Laser 632 nm, matches 4500 data · Advanced Data output/GEM SECS · System Circuit Boards! · Tencor 6100OEM 代工型號說明
The Surfscan 6100 is a tool that is capable of detecting defects on a surface. It can locate, measure the size of, and count the number of defects that are as small as 0.157 micrometers in size. Additionally, it has a high capture rate of 95%, meaning it can accurately detect the vast majority of defects present on a surface.文檔
無文檔