描述
Fully Refurbished & Calibrated Automatic Calibration Flatscreen Monitor System Calibrated & Demonstrated Calibration Standard Wafer Included配置
TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool Cassette to Cassette Handling of 3” – 6” Wafers New HeNe 2mW Laser, 632.8 nm Wavelength New HeNe Laser Power Supply 0.2 µ Particle Size SensitivityOEM 代工型號說明
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KLA
SURFSCAN 4500
已驗證
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Refurbished
作業狀態:
未知
產品編號:
110911
晶圓尺寸:
未知
年份:
1987
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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查看全部KLA
SURFSCAN 4500
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Refurbished
作業狀態:
未知
產品編號:
110911
晶圓尺寸:
未知
年份:
1987
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Fully Refurbished & Calibrated Automatic Calibration Flatscreen Monitor System Calibrated & Demonstrated Calibration Standard Wafer Included配置
TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool Cassette to Cassette Handling of 3” – 6” Wafers New HeNe 2mW Laser, 632.8 nm Wavelength New HeNe Laser Power Supply 0.2 µ Particle Size SensitivityOEM 代工型號說明
未提供文檔
無文檔