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描述
無描述配置
無配置OEM 代工型號說明
The Candela CS920 is the first integrated surface and photoluminescence defect detection system for Silicon Carbide wafers. It has a UV laser for high sensitivity to defects and can detect and classify SiC epitaxy layer surface defects and crystal defects. These features help improve epitaxy yield.文檔
無文檔
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Running
產品編號:
112452
晶圓尺寸:
未知
年份:
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA CS920
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Running
產品編號:
112452
晶圓尺寸:
未知
年份:
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
The Candela CS920 is the first integrated surface and photoluminescence defect detection system for Silicon Carbide wafers. It has a UV laser for high sensitivity to defects and can detect and classify SiC epitaxy layer surface defects and crystal defects. These features help improve epitaxy yield.文檔
無文檔