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KLA CANDELA CS900
    描述
    Surface Analyzer
    配置
    - Software version: 10.2.4.0101 - This is a CS900 running CS920 software -Tool powers on and initializes
    OEM 代工型號說明
    KLA / TENCOR Candela CS900 surface defect and EPI epitaxial defect inspection equipment is used for inspection and analysis of defects in Si silicon wafers and GaN epitaxial wafers, SiC substrates and SiC epitaxial wafers. Other applications for the Candela CS900 include EPI epitaxial defects, including particles, scratches, pits, pollution, traces, and PL function can also be added for detection some GaN EPI defects and SiC EPI defects. The device is compatible with transparent and opaque films.
    文檔
    文件圖示

    Candela CS 900.mov

    KLA

    CANDELA CS900

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 超過30天前

    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    90138

    晶圓尺寸:

    4"/100mm, 5"/125mm, 6"/150mm

    年份:

    2017

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    KLA CANDELA CS900

    KLA

    CANDELA CS900

    Defect Inspection
    年份: 2017條件: 二手
    上次驗證超過30天前

    KLA

    CANDELA CS900

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過30天前
    listing-photo-54ee853babee4b96a18ea548c92be66e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/54ee853babee4b96a18ea548c92be66e/d4da584ce58747398cacc75ee9648596_7037c292588b43ce999c7f57e490fa8d_mw.jpeg
    listing-photo-54ee853babee4b96a18ea548c92be66e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/54ee853babee4b96a18ea548c92be66e/20c26e0395794c888341511130170e18_d3d89809c40d424084775ee28123dc00_mw.jpeg
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    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    90138

    晶圓尺寸:

    4"/100mm, 5"/125mm, 6"/150mm

    年份:

    2017

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Surface Analyzer
    配置
    - Software version: 10.2.4.0101 - This is a CS900 running CS920 software -Tool powers on and initializes
    OEM 代工型號說明
    KLA / TENCOR Candela CS900 surface defect and EPI epitaxial defect inspection equipment is used for inspection and analysis of defects in Si silicon wafers and GaN epitaxial wafers, SiC substrates and SiC epitaxial wafers. Other applications for the Candela CS900 include EPI epitaxial defects, including particles, scratches, pits, pollution, traces, and PL function can also be added for detection some GaN EPI defects and SiC EPI defects. The device is compatible with transparent and opaque films.
    文檔
    文件圖示

    Candela CS 900.mov

    類似上架商品
    查看全部
    KLA CANDELA CS900

    KLA

    CANDELA CS900

    Defect Inspection年份: 2017條件: 二手上次驗證: 超過30天前