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KLA CANDELA 8600
    描述
    KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simultaneously measures surface reflectivity and topography for automatic defect detection and classification. The defect detection system's inspection technology combines scatterometry, ellipsometry, reflectometry, and topographical analysis to non-destructively inspect wafer surfaces for defects, and film thickness uniformity, of opaque substrates, epi layers, and transparent film coatings (SiC, GaN, sapphire). *. Fully refurbished. Installed in Clean-room. Can demonstrate anytime.
    配置
    KLA-Tencor Candela 8600 Working - Laser: Oblique(50mW, 405nm), Normal(85mW, 660nm) - Spot size: 5㎛ x 4㎛. - Particle detection: smaller than 0.08㎛ on silicon substrate. - Scratch: 0.1㎛ wide, 1~2nm deep. - Pits and Bumps: 20㎛ diameter, 50Å;; deep. - Stains: 20㎛ diameter, 10Å;; thick. - can be used for both epi and bare substrate. - can be used for Si, GaAs, Al2O3,SiC substrate. - Substrage thickness: 350㎛ ~ 1,300㎛. - Air Balance system ULPA and HEPA air filter(replaced new one). - Input Power 230V 5A 50/60Hz - Input Air: CDA 90 PSI
    OEM 代工型號說明
    未提供
    文檔

    無文檔

    KLA

    CANDELA 8600

    verified-listing-icon

    已驗證

    類別

    Defect Inspection
    上次驗證: 27 天前
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    65982


    晶圓尺寸:

    6"/150mm


    年份:

    2011

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    KLA CANDELA 8600
    KLACANDELA 8600Defect Inspection
    年份: 2011條件: 二手
    上次驗證27 天前

    KLA

    CANDELA 8600

    verified-listing-icon

    已驗證

    類別

    Defect Inspection
    上次驗證: 27 天前
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/06e7ad43f5844f2ea86fddf81856f462_1_mw.png
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/6182ff75d83347779a5e2aaff5fa9110_2_mw.png
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/bf416103d4da474aa954c833703d27b6_004_mw.jpg
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    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/8108265427a24e6ab35e451b2d0bea89_5_mw.png
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/a67304172d5c4adbab524d289b334133_3_mw.png
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/76656571f7cc47c39ecba70a60c91818_4_mw.png
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/badaa87e260d4250bafc010a49670703_006_mw.jpg
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    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/227ded7d206244029dde18e50cf704e0_007_mw.jpg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    65982


    晶圓尺寸:

    6"/150mm


    年份:

    2011


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simultaneously measures surface reflectivity and topography for automatic defect detection and classification. The defect detection system's inspection technology combines scatterometry, ellipsometry, reflectometry, and topographical analysis to non-destructively inspect wafer surfaces for defects, and film thickness uniformity, of opaque substrates, epi layers, and transparent film coatings (SiC, GaN, sapphire). *. Fully refurbished. Installed in Clean-room. Can demonstrate anytime.
    配置
    KLA-Tencor Candela 8600 Working - Laser: Oblique(50mW, 405nm), Normal(85mW, 660nm) - Spot size: 5㎛ x 4㎛. - Particle detection: smaller than 0.08㎛ on silicon substrate. - Scratch: 0.1㎛ wide, 1~2nm deep. - Pits and Bumps: 20㎛ diameter, 50Å;; deep. - Stains: 20㎛ diameter, 10Å;; thick. - can be used for both epi and bare substrate. - can be used for Si, GaAs, Al2O3,SiC substrate. - Substrage thickness: 350㎛ ~ 1,300㎛. - Air Balance system ULPA and HEPA air filter(replaced new one). - Input Power 230V 5A 50/60Hz - Input Air: CDA 90 PSI
    OEM 代工型號說明
    未提供
    文檔

    無文檔

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    Defect Inspection年份: 2011條件: 二手上次驗證: 27 天前