描述
無描述配置
無配置OEM 代工型號說明
The AIT XP is a high-throughput scanning product for patterned wafer inspection that adjusts dynamically to all die regions, delivering maximum sensitivity and improved detection of killer defects. It features faster recipe setup, improved recipe robustness, and user-friendly setup templates. It enables improved cost of ownership and extends a fab’s inspection capability. The 23xx series, the AIT series, and the eS30 form part of a KLA-Tencor strategy that combines inspection technologies to offer fabs a new, customized strategy for capturing and controlling defects. KLA-Tencor delivers an overall defect-control solution through a comprehensive range of defect reduction and control technology.文檔
無文檔
KLA
AIT XP
類別
Defect Inspection
上次驗證: 13 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
19241
晶圓尺寸:
8"/200mm
年份:
2003
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
The AIT XP is a high-throughput scanning product for patterned wafer inspection that adjusts dynamically to all die regions, delivering maximum sensitivity and improved detection of killer defects. It features faster recipe setup, improved recipe robustness, and user-friendly setup templates. It enables improved cost of ownership and extends a fab’s inspection capability. The 23xx series, the AIT series, and the eS30 form part of a KLA-Tencor strategy that combines inspection technologies to offer fabs a new, customized strategy for capturing and controlling defects. KLA-Tencor delivers an overall defect-control solution through a comprehensive range of defect reduction and control technology.文檔
無文檔