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KLA 2552
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    the KLA 2552, and an off-line Review Station, the KLA 2608, provides semiconductor manufacturers with a yield management system sensitive enough for engineering analysis and fast enough for in-line monitoring of the semiconductor manufacturing process.
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    KLA

    2552

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    已驗證

    類別

    Defect Inspection
    上次驗證: 超過60天前
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    條件:

    Used


    作業狀態:

    未知


    產品編號:

    79368


    晶圓尺寸:

    6"/150mm


    年份:

    未知

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    KLA 2552
    KLA2552Defect Inspection
    年份: 0條件: 二手
    上次驗證超過60天前

    KLA

    2552

    verified-listing-icon

    已驗證

    類別

    Defect Inspection
    上次驗證: 超過60天前
    listing-photo-95f316bbeb29409d811172df8ac47447-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    79368


    晶圓尺寸:

    6"/150mm


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    the KLA 2552, and an off-line Review Station, the KLA 2608, provides semiconductor manufacturers with a yield management system sensitive enough for engineering analysis and fast enough for in-line monitoring of the semiconductor manufacturing process.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA 2552
    KLA
    2552
    Defect Inspection年份: 0條件: 二手上次驗證: 超過60天前
    KLA 2552
    KLA
    2552
    Defect Inspection年份: 0條件: 二手上次驗證: 超過60天前
    KLA 2552
    KLA
    2552
    Defect Inspection年份: 0條件: 二手上次驗證: 超過60天前