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KLA 2351
    描述
    Bright field detection No missing parts Current size : 12
    配置
    無配置
    OEM 代工型號說明
    The KLA / TENCOR 2351 is a Bright-Field Wafer Inspection System. The TENCOR 2351 can be used with 200mm wafer sizes. In July of 2001, an upgrade to the 2350 was introduced, the 2351, which offers enhancements in sensitivity, throughput and ease of use. The KLA 2135 is a wafer inspection system that detects all types of yield-relevant defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and uses advanced sensor and image processing technologies. The 2135 consistently detects the widest range of defects at the speeds required for high-volume wafer production.
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    KLA

    2351

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Deinstalled


    產品編號:

    107147


    晶圓尺寸:

    8"/200mm, 12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    KLA 2351

    KLA

    2351

    Defect Inspection
    年份: 0條件: 二手
    上次驗證超過60天前

    KLA

    2351

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過60天前
    listing-photo-ab2de3c4577e45da994776f5b89a617a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Deinstalled


    產品編號:

    107147


    晶圓尺寸:

    8"/200mm, 12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Bright field detection No missing parts Current size : 12
    配置
    無配置
    OEM 代工型號說明
    The KLA / TENCOR 2351 is a Bright-Field Wafer Inspection System. The TENCOR 2351 can be used with 200mm wafer sizes. In July of 2001, an upgrade to the 2350 was introduced, the 2351, which offers enhancements in sensitivity, throughput and ease of use. The KLA 2135 is a wafer inspection system that detects all types of yield-relevant defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and uses advanced sensor and image processing technologies. The 2135 consistently detects the widest range of defects at the speeds required for high-volume wafer production.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA 2351

    KLA

    2351

    Defect Inspection年份: 0條件: 二手上次驗證:超過60天前
    KLA 2351

    KLA

    2351

    Defect Inspection年份: 0條件: 二手上次驗證:超過60天前