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KLA 2135
    描述
    Wafer defect detection
    配置
    無配置
    OEM 代工型號說明
    The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.
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    KLA

    2135

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    110360


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    KLA 2135

    KLA

    2135

    Defect Inspection
    年份: 1997條件: 二手
    上次驗證超過60天前

    KLA

    2135

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過60天前
    listing-photo-74b9965908f74fb8bc27b1c4516d530c-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    110360


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Wafer defect detection
    配置
    無配置
    OEM 代工型號說明
    The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA 2135

    KLA

    2135

    Defect Inspection年份: 1997條件: 二手上次驗證:超過60天前
    KLA 2135

    KLA

    2135

    Defect Inspection年份: 0條件: 二手上次驗證:超過60天前
    KLA 2135

    KLA

    2135

    Defect Inspection年份: 0條件: 二手上次驗證:超過60天前