描述
無描述配置
Brightfield Wafer Defect Inspection SystemOEM 代工型號說明
未提供文檔
無文檔
KLA
2122
已驗證
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
56597
晶圓尺寸:
未知
年份:
1996
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
2122
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
56597
晶圓尺寸:
未知
年份:
1996
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
Brightfield Wafer Defect Inspection SystemOEM 代工型號說明
未提供文檔
無文檔