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描述
E-beam Inspection配置
無配置OEM 代工型號說明
The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.文檔
無文檔
KLA
eS805
類別
Defect Inspection
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
50097
晶圓尺寸:
12"/300mm
年份:
未知
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Money Back Guarantee
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Refurbishment Services
Available
描述
E-beam Inspection配置
無配置OEM 代工型號說明
The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.文檔
無文檔