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KLA eS805
    描述
    E-beam Inspection
    配置
    無配置
    OEM 代工型號說明
    The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.
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    KLA

    eS805

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    已驗證

    類別

    Defect Inspection
    上次驗證: 超過30天前
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    50097


    晶圓尺寸:

    12"/300mm


    年份:

    未知

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    KLA eS805
    KLAeS805Defect Inspection
    年份: 0條件: 二手
    上次驗證超過30天前

    KLA

    eS805

    verified-listing-icon

    已驗證

    類別

    Defect Inspection
    上次驗證: 超過30天前
    listing-photo-081833c64422445888d82f4648c617b3-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    50097


    晶圓尺寸:

    12"/300mm


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    E-beam Inspection
    配置
    無配置
    OEM 代工型號說明
    The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA eS805
    KLA
    eS805
    Defect Inspection年份: 0條件: 二手上次驗證: 超過30天前