描述
無描述配置
KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) - Stage, electron source, pre-aligner, feed throughs, stage lasers included Scan amp boards are missing on both toolsOEM 代工型號說明
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.文檔
無文檔
KLA
eS32
已驗證
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Parts Tool
作業狀態:
未知
產品編號:
44484
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
eS32
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Parts Tool
作業狀態:
未知
產品編號:
44484
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) - Stage, electron source, pre-aligner, feed throughs, stage lasers included Scan amp boards are missing on both toolsOEM 代工型號說明
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.文檔
無文檔