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描述
無描述配置
KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) - Stage, electron source, pre-aligner, feed throughs, stage lasers included Scan amp boards are missing on both toolsOEM 代工型號說明
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.文檔
無文檔
KLA
eS32
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Parts Tool
作業狀態:
未知
產品編號:
44484
晶圓尺寸:
未知
年份:
未知
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Refurbishment Services
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描述
無描述配置
KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) - Stage, electron source, pre-aligner, feed throughs, stage lasers included Scan amp boards are missing on both toolsOEM 代工型號說明
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.文檔
無文檔