描述
Taken Offline in July配置
6"OEM 代工型號說明
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.文檔
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KLA
AIT II
已驗證
類別
Defect Inspection
上次驗證: 28 天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
100099
晶圓尺寸:
6"/150mm
年份:
2000
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
AIT II
類別
Defect Inspection
上次驗證: 28 天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
100099
晶圓尺寸:
6"/150mm
年份:
2000
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Taken Offline in July配置
6"OEM 代工型號說明
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.文檔
無文檔